Thermal Shock Test Chamber | Two-Zone
The ITM-LAB CTS Series Two-Zone Thermal Shock Test Chamber is designed to evaluate the resistance of electronic components, automotive parts, semiconductors, and industrial materials to sudden temperature changes.
Featuring independent hot and cold chambers, the system automatically transfers test specimens between two temperature zones to assess potential failures caused by thermal expansion, contraction, and material stress.
Available in 50L–300L capacities, with customized configurations to meet different testing requirements.
Low-Temperature Options: −40°C / −55°C / −65°C
High-Temperature Shock Range: +60°C to +150°C
Temperature Fluctuation: ±0.5°C
Chamber Capacity: 50L–300L / Customizable
Specimen Transfer: Automatic
Inner Chamber: SUS304 Stainless Steel
Separate temperature zones enable rapid changes in specimen exposure temperature without repeatedly heating and cooling a single test space.
The specimen basket automatically moves between the hot and cold chambers according to the programmed test cycle.
Type A (−40°C), Type B (−55°C), and Type C (−65°C) are available for different low-temperature testing requirements.
Temperature fluctuation of ±0.5°C under specified operating conditions.
SUS304 stainless steel interior with thermal insulation and sealing for laboratory operation.
Automatic control of temperature settings, exposure periods, specimen transfer, and test cycles.

| Model | Capacity | Internal Dimensions (W × D × H) |
|---|---|---|
| CTS-50L | 50 L | 350 × 360 × 400 mm |
| CTS-100L | 100 L | 500 × 400 × 400 mm |
| CTS-150L | 150 L | 600 × 500 × 500 mm |
| CTS-200L | 200 L | 650 × 500 × 620 mm |
| CTS-300L | 300 L | 900 × 670 × 500 mm |
| Customized | On request | According to specimen requirements |
| Parameter | Specification |
|---|---|
| Chamber Design | Two-Zone (Hot & Cold) |
| Low-Temperature Type A | −40°C |
| Low-Temperature Type B | −55°C |
| Low-Temperature Type C | −65°C |
| High-Temperature Shock Range | +60°C to +150°C |
| Preheating Temperature Range | +60°C to +200°C |
| Precooling Temperature Range | −70°C to 0°C |
| Temperature Fluctuation | ±0.5°C |
| Specimen Transfer | Automatic |
| Inner Chamber Material | SUS304 Stainless Steel |
| Cooling Method | Air Cooling / Water Cooling |
The CTS Series maintains separate hot and cold environments. During testing, an automatic transfer mechanism moves the specimen basket between the two chambers according to the programmed exposure time and cycle count.
This process creates rapid changes in specimen exposure temperature and helps evaluate potential damage caused by repeated thermal stress.

The CTS Series supports thermal shock reliability testing for:
Automotive Electronics: ECUs, sensors, connectors, and electronic modules.
Semiconductors: IC packages and electronic components.
PCB Assemblies: Solder joints, circuit boards, and electronic connections.
Battery Components: Battery-related materials, connectors, and enclosures, subject to specimen safety requirements.
Industrial Materials: Plastics, rubber, seals, adhesives, and composites.

The CTS Series can be configured for relevant temperature shock procedures, including:
IEC 60068-2-14 — Change of Temperature (Test Na)
GB/T 2423.22 — Change of Temperature
MIL-STD-810H Method 503.7 — Temperature Shock
JEDEC JESD22-A106 — Thermal Shock
Test applicability depends on the selected procedure, temperature conditions, specimen load, transfer performance, and chamber configuration.
ITM-LAB conducts pre-shipment inspection and functional checks of CTS thermal shock chambers, including relevant chamber operation, automatic specimen transfer, and control functions.
Find the Right Thermal Shock Chamber for Your Test
ITM-LAB offers standard and customized CTS two-zone thermal shock chambers for industrial reliability testing.
To receive a suitable configuration and quotation, please provide:
Specimen dimensions and weight
Required high and low test temperatures
Exposure time and test cycles
Applicable test standard
Preferred chamber capacity





A two-zone thermal shock chamber evaluates how products withstand sudden changes between high and low temperatures. It is commonly used to test automotive electronics, semiconductor packages, PCBs, connectors, sensors, and industrial materials for potential failures caused by repeated thermal stress.
The CTS Series uses separate hot and cold chambers. An automatic transfer mechanism moves the specimen basket between the two temperature zones according to the programmed exposure time and test cycles.
The CTS Series offers three low-temperature configurations:
Type A: −40°C
Type B: −55°C
Type C: −65°C
The high-temperature shock range is +60°C to +150°C. Custom configurations can be discussed according to specific test requirements.
The CTS Series can be configured for thermal shock testing procedures such as IEC 60068-2-14 Test Na, GB/T 2423.22, MIL-STD-810H Method 503.7, and JEDEC JESD22-A106.
Compatibility with a specific standard depends on the required temperature conditions, specimen load, transfer performance, and selected chamber configuration.
Standard capacities include 50L, 100L, 150L, 200L, and 300L. ITM-LAB also offers customized chamber dimensions based on specimen size, quantity, and testing requirements.
Please provide the specimen dimensions and weight, required high and low temperatures, exposure time, number of test cycles, applicable test standard, and preferred chamber capacity.
ITM-LAB will review these requirements and recommend a suitable CTS thermal shock chamber configuration.